低位数线阵CCD高精度非接触尺寸测量

马秦生

马秦生. 低位数线阵CCD高精度非接触尺寸测量[J]. 武汉大学学报 ( 信息科学版), 1989, 14(4): 60-66.
引用本文: 马秦生. 低位数线阵CCD高精度非接触尺寸测量[J]. 武汉大学学报 ( 信息科学版), 1989, 14(4): 60-66.
Ma Qinsheng. High Precision Noncontact Dimension Measurement Using Linear Array CCD with Fewer Elements[J]. Geomatics and Information Science of Wuhan University, 1989, 14(4): 60-66.
Citation: Ma Qinsheng. High Precision Noncontact Dimension Measurement Using Linear Array CCD with Fewer Elements[J]. Geomatics and Information Science of Wuhan University, 1989, 14(4): 60-66.

低位数线阵CCD高精度非接触尺寸测量

High Precision Noncontact Dimension Measurement Using Linear Array CCD with Fewer Elements

  • 摘要: 从提高测量精度、增大测量范围、经济、实用的角度出发,本文分析了常用的两种线阵CCD非接触尺寸测量方式存在的问题,提出了"单眼"单端扫描测量方式,并设计出了适合测量应用的线阵CCD驱动电路和计算机通用接口。通过实验,证明此方法是行之有效的。
    Abstract: In order to improve the precision and range of measureme nteconomically and practi-cally, this paper discusses the problems of the common method of noncontact dimensionmeasurement using linear array CCD. A "simple eye-single end scanning" measurementmethod is proposed. A practial linear array CCD driver-circuit and computer generalinterface has been obtained. The experiment results given in this paper indicate that thenew method is available.
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出版历程
  • 收稿日期:  1989-05-07
  • 发布日期:  1989-04-04

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