Using Optical/Digital Hybrid Processor to Inspect Fabric Defects

Fabric inspection plays a significant part in the textile industry, but it can not be done automatically yet, because the full number of defect fault is large and the defect cannot be inspected easily.In this paper, the defect fault information has been transformed by an optical system, sampled by a wedge/ring detector and then classified by a computer by using the pattern recognition theory. We have obtained a good result in our experiment.