Hu Youlin. Guided Wave Method for Characterization of Thin Films as Compared to Wideband Spectrophotometric Method[J]. Geomatics and Information Science of Wuhan University, 1990, 15(4): 70-75.
Citation:
Hu Youlin. Guided Wave Method for Characterization of Thin Films as Compared to Wideband Spectrophotometric Method[J]. Geomatics and Information Science of Wuhan University, 1990, 15(4): 70-75.
Hu Youlin. Guided Wave Method for Characterization of Thin Films as Compared to Wideband Spectrophotometric Method[J]. Geomatics and Information Science of Wuhan University, 1990, 15(4): 70-75.
Citation:
Hu Youlin. Guided Wave Method for Characterization of Thin Films as Compared to Wideband Spectrophotometric Method[J]. Geomatics and Information Science of Wuhan University, 1990, 15(4): 70-75.
Guided Wave Method for Characterization of Thin Films as Compared to Wideband Spectrophotometric Method
The guided wave method for characterization of thin films is compared experimentally with wideband spectrophotometric method.This proves the reliability and high precision of the guided wave method.
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