Hu Youlin. Guided Wave Method for Characterization of Thin Films as Compared to Wideband Spectrophotometric Method[J]. Geomatics and Information Science of Wuhan University, 1990, 15(4): 70-75.
Citation: Hu Youlin. Guided Wave Method for Characterization of Thin Films as Compared to Wideband Spectrophotometric Method[J]. Geomatics and Information Science of Wuhan University, 1990, 15(4): 70-75.
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Guided Wave Method for Characterization of Thin Films as Compared to Wideband Spectrophotometric Method

    Abstract
  • The guided wave method for characterization of thin films is compared experimentally with wideband spectrophotometric method.This proves the reliability and high precision of the guided wave method.
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